M&M 2017 – Application of serial sectioning microscopy to AM metallic samples

  • vsundar
    Keymaster
    26

    #1760

    Over the past year, the authors have explored the use of a serial section microscopy system to characterize the 3D topological and microstructural aspects of metallic AM laboratory samples to improve the linkage between process intent and the resultant structure. We have employed mechanical-polishing based sectioning coupled to optical and scanning electron microscopes, as this approach enables volumetric coverage of laboratory-scale samples (typical volumes ranging from 5 – 20 mm3) while maintaining micrometer-level spatial resolution. Our initial efforts have focused on quantifying the internal porosity, microcracks, and surface roughness of AM titanium and nickel alloy samples, as, these features are easily observed and amenable to image segmentation from as-polished bright field epi-illumination optical microscopy images.

    Extended abstract attached. This will be presented at M&M 2017 at: Session A06.1 Bridging Length Scales with 2D, 3D, and 4D Multiscale/Multimodal Microscopy, Presentation 308 Application of Serial Sectioning Microscopy to Additively Manufactured Metallic Samples; M Chapman, JM Scott; UES Inc.; E Schwalbach, M Groeber, S Donegan, M Uchic; U.S. Air Force Research Laboratory.

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M&M 2017 – Application of serial sectioning microscopy to AM metallic samples